节点文献
两步相移实现投影栅相位测量轮廓术
Two-Step Phase-Shifting Technique for Phase Measurement Profilometry by Grating Projection
【摘要】 提出一种新的投影栅相位测量方法———两步相移法。该方法只需两幅相移条纹图 ,因此计算量小 ,速度快。给出了实验及计算结果 ,并同四步相移法进行了比较 ,证明了该方法具有较高的精度。
【Abstract】 The phase measurement method by grating projection is an effective technique in 3 D shape measurement. A novel method-two step phase shifting technique for phase measurement profilometry is proposed. In this method only two phase shifted fringe patterns are necessary in order to extract the phase values, and the phase unwrapping procure is not needed. Hence, this method requires little computing time. The experimental results are given. A comparison, which demonstrates the high accuracy of the new method, is made between the proposed two step and conventional four step phase shifting method.
【关键词】 光学测量;
相位测量轮廓术;
栅线投影;
相移法;
【Key words】 optical measurement; phase measurement profilometry; grating projection; phase shifting method;
【Key words】 optical measurement; phase measurement profilometry; grating projection; phase shifting method;
【基金】 国家自然科学基金 (10 0 72 0 17);非线性力学国家重点实验室开放课题资助课题
- 【文献出处】 光学学报 ,Acta Optica Sinica , 编辑部邮箱 ,2003年01期
- 【分类号】O439
- 【被引频次】76
- 【下载频次】740