【摘要】 烧渗银电极对压敏电阻的性能是有很大影响的。为了弄清Ag对(Co、Nb)掺杂的新型SnO2压敏材料电学性质的影响,做了组分为SnO2+1.50%CoCl2·6H2O+0.10%Nb2O5+x%Ag2O(x=0.00、0.02、0.50和1.00)的系统实验。当AgO的含量从0.00增加到1mol%时,(Co,Nb)掺杂SnO2压敏电阻的击穿电压从349V/mm增大到429V/mm,1kHz时的相对介电常数从2240减小到1560。晶界势垒高度测量揭示,SnO2的晶粒尺寸的迅速减小是击穿电压急剧增高和介电常数迅速减小的主要原因。对Ag掺杂量增加引起SnO2晶粒减小的根源进行了解释。更多还原

【Abstract】 The varistor electrodes applied by firing processing have a great influence on the properties of the varistors. In order to clarify the effects of Ag on the novel SnO₂ varistors, the experiment for compositions of SnO₂+1.50%CoCl₂·H₂O+0.10%Nb₂O₅+_x% Ag₂O （_x=0.00, 0.02, 0.50, 1.00） was conducted. It was found that the breakdown voltage of the SnO₂ based varistors increased from 349V/mm to 429V/mm, and the relative dielectric constant at 40Hz of the SnO₂ based varistors decreased from 2240 to 1560 with increasing Ag₂O concentration from 0 to 1.00mol%. Measurement of the barrier height at grain boundaries reveal that the decrease of the SnO₂ grain size with increasing Ag₂O concentration from 0 to 1.00mol% was the reason for raising the breakdown voltage and lowering the dielectric constant. The origin for the deduction of SnO₂ grain size with increasing Ag₂O concentration was explained.更多还原