【摘要】 在大量实验的基础上,通过理论分析和数据处理,采用威布尔概率纸图估法,评估了为某种设备的特殊需要生产的一种新型硅光电探测器的可靠性和寿命。在正常工作条件(300K)时,器件的平均寿命为1.04×108h;在40℃时,器件的失效率等级达到国家标准规定6级。详细分析了光敏二极管的失效模式及失效机理,提出了提高光敏二极管的可靠性和寿命的措施。更多还原

【Abstract】 The reliability and life of a new silicon photoelectric detector,which was produced for the special demand of some sort of equipment have been evaluated.The evaluation is on the basis of large amounts of experiments,theoretic analysis and data processing,adopting the Weibull probability drawing evaluating method.The average life of this device is 1.04×108 h at the normal working temperature 300 K.The invalidity of the devices have reached the sixth level of national standards at 40 ℃.This paper also analyzed the invalid pattern and mechanism of the devices,and bring out the mathod to improve their reliability and life.更多还原