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Si/C/N晶须的微波介电性能

MICROWAVE DIELECTRIC PROPERTY OF Si/C/N NANO WHISKER

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【作者】 焦桓周万城罗发

【Author】 JIAO Huan, ZHOU Wancheng, LUO Fa (State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi′an 710072, China)

【机构】 西北工业大学凝固技术国家重点实验室西北工业大学凝固技术国家重点实验室 西安710072西安710072西安710072

【摘要】 研究了Si/C/N纳米晶须的制备、组成和微波介电性能。利用CVD法制备了化学组成一定的纳米Si/C/N晶须,XRD研究发现晶须的物相主要为β-SiC。热重分析表明该晶须在700℃以上开始氧化,具有较好的抗氧化性。测定了Si/C/N晶须的复介电常数与作用频率的关系,并计算了介电损耗角正切。依据介电性能数据,分别设计了单层和双层吸波材料,对所设计材料的吸波性能进行了计算。对Si/C/N纳米晶须的吸波机理进行了初步的探讨。

【Abstract】 Si/C/N nano whisker with certain composition was prepared by Chemical Vapor Depo sition (CVD). The phase of the whisker was determined as β -SiC by XRD. TG analysis indicated that the whisker can resist oxidation up to 700 ℃. Depende nce of the dielectric constant and loss tangent on the frequency was investigate d. Based on the dielectric constant, mono and double layer absorber materials were designed , and the absorber property of the designed materials was estimated. The mech anism of microwave depletion by Si/C/N nano whisker was discussed, which is due to the dopant of nitrogen atoms in SiC lattice.

【基金】 航空基金(2G53045)
  • 【文献出处】 复合材料学报 ,Acta Materiae Compositae Sinica , 编辑部邮箱 ,2003年04期
  • 【分类号】TB34
  • 【被引频次】19
  • 【下载频次】205
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