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α粒子辐照致DNA双链断裂的AFM观测
Atomic force microscopy observation of DNA double strand breaks irradiated with α-particles
【摘要】 在放射生物学中 ,脱氧核糖核酸 (DNA)是电离辐射引致细胞杀伤或转化的主要靶分子 ,研究它的电离辐射损伤具有深远的意义。以此为目的 ,选用LET为 90keV μm的α粒子 ,以不同的剂量对纯化的质粒DNA进行辐照 ,并用原子力显微镜 (AFM)对其所诱发的DNA双链断裂进行了定性观测。同时 ,用凝胶电泳技术对DNA的形态进行了分析
【Abstract】 DNA is the critical target for ionizing-radiation-induced cell killing or transformation in radiobiology. In particular, DNA double strand breaks(DSBs)are considered as the most important molecular damage. It has a far-reaching significance to study DNA damage induced by ionizing radiation. With this purpose, purified plasmid DNA(in aqueous solution) was irradiated with 90keV/μm α-particle produced by a 241Am source at different doses, and atomic force microscopy was used to observe the DNA double strand breaks. In addition, plasmid DNA form have been analyzed by gel electrophoresis technology.
【Key words】 particle; ionizing radiation; atomic force microscopy; plasmid DNA; double strand breaks;
- 【文献出处】 电子显微学报 ,Journal of Chinese Electron Microscopy Society , 编辑部邮箱 ,2003年02期
- 【分类号】Q691
- 【被引频次】5
- 【下载频次】109