【摘要】 探孔场发射显微镜可以观测样品的场发射图象 ,又能测量局域场发射电流和总场发射电流与电压的关系 .本文利用具有二维调节探孔位置的场发射显微镜装置测量了单壁碳纳米管场发射图象不同区域、不同吸附状态和经过热处理后的I V特性 .更多还原

【Abstract】 A probe-hole Field Emission Microscope (FEM) features the capability of measuring the respective dependence of local and total field emission currents on applied voltage.A FEM equipped with a probe-hole,which could be submitted to two-dimensional motion,was employed to acquire curves of field emission current versus applied voltage of single-walled carbon nanotubes (SWCNTs).The field emission currents were acquired from different regions and different adsorption states.Furthermore,the influence of heat treatment on current-voltage behaviors of the SWCNTs was also studied.更多还原