节点文献
高温超导薄膜微波表面电阻测试方法的讨论
MEASUREMENT METHOD OF MICROWAVE SURFACE RESISTANCE OF HIGH T_c SUPERCONDUCTIVE THIN FILMS
【摘要】 介绍一种工作在 1 2GHz附近的高温超导薄膜微波表面电阻Rs 测试方法 ,该系统采用低损耗高介电常数的蓝宝石构成工作在TE0 1 1 +δ谐振模式的介质谐振器 ,在 77K时 ,利用它可成功地用于单片50 .8mm较大超导薄膜的微波表面电阻Rs 无损伤测试 .并与工作在 1 7GHz附近的用于测试1 0mm高温超导薄膜微波表面电阻测试方法进行了比较 .这种测试方法提高了整个测试系统的品质因素 ,体积小 ,操作方便 ,且所需实验条件简单 ,测试灵敏度高 ,具有简便、快捷、适合于工业化生产检测的特点 .
【Abstract】 A measurement system for characterization of microwave surface resistance of HTSC thin films was presented. In this system a high Q factor sapphire resonator probe with TE-{011δ} mode was developed to measure the surface resistance R-s of a single piece of HTSC thin film at 12GHz and 77K. This system was compared with another system at 17GHz. The method has advantages of nondestructivity, single sample, high Q value, high sensitivity, convenient experiment setup, samll volume, and flexibility in operation.
- 【文献出处】 低温物理学报 ,Chinese Journal of Low Temperature Physics , 编辑部邮箱 ,2003年S1期
- 【分类号】O484
- 【被引频次】1
- 【下载频次】139