节点文献
大面积高温超导薄膜临界温度无损伤测试
NON-DESTRUCTIVE MEASUREMENT OF CRITICAL TEMPERATURE FOR LARGE-AREAR HTSC THIN FILMS
【摘要】 我们设计并制作了高温超导薄膜无损伤超导转变温度Tc 测试系统 ,可以在直径 2英寸范围内同时测量 1 3个位置上的Tc.测试过程中可以用图形或数字监视薄膜的超导转变 ,方便可靠 .系统采用液氮制冷 ,测试速度快 ,测量误差约± 0 .2K .对于直径 2英寸或小于 2英寸薄膜的Tc,本系统是一套实用可靠的测量设备 .
【Abstract】 Non-destructive measurement system of critical temperature for large area high-T-c superconducting thin films was designed and fabricated. 13 T-c′s in 2 inch diameter thin film can be measured at the same time. During the measurement the signals can be displayed on the screen by figures or by numeral. The measurement is fast and reliable. The measurement error is in the range of 0.2K.
- 【文献出处】 低温物理学报 ,Chinese Journal of Low Temperature Physics , 编辑部邮箱 ,2003年S1期
- 【分类号】O484
- 【被引频次】1
- 【下载频次】93