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用飞秒光克尔方法测量镶嵌在PVA膜的SnO₂纳米晶簇的三阶光学非线性（英文）

Large Third-order Optical Nonlinearity of SnO₂/PVA Composite Thin Film Measured by Femtosecond Optical Kerr Effect Method

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【Author】 LIANG Ruisheng (School for Information and Optoelectronic Science and Engineering,South China Normal University,Guangzhou,510631) GONG Qihuang WANG Shufeng HUANG Wentao WANG Dehuang (National Laboratory for Mesoscopic Physics and Physics School,Peking University,Beijing,100871) CHENG Humin MA Jiming (College of Chemistry and Molecular Enginnering,Peking University,Beijing,100871)

【机构】华南师范大学信息光电子科技学院；北京大学物理学院、人工微结构和介观物理国家重点实验室；北京大学化学与分子工程学院；北京大学化学与分子工程学院广州； 510631；北京； 100871； 100871；

【摘要】报道了用飞秒光克尔实验系统测量镶嵌在聚乙烯醇 (PVA)薄膜的二氧化锡 (SnO2 )纳米晶簇的光学非线性的实验结果 ,平均粒径为 10nm和 2～ 3nm的SnO2 晶簇的三阶非线性极化率 χ(3)分别为 4 30 1× 10 -14 和 1 72 8× 10 -13esu ,并对其原因进行了分析。实验还表明SnO2 PVA薄膜的光学响应是很快的 ,为 5 0fs。由于聚乙烯醇薄膜的性能稳定 ,易于生产 ,上述结果显示它可能成为制作光器件的优良基质更多还原

【Abstract】 The third-order nonlinear susceptibility χ (3) of SnO 2/PVA composite thin film was measured by a femtosecond time-resolved optical Kerr effect OKE at 810?nm wavelength.The χ (3) observed was 4 301×10 -14 esu for SnO 2 nanoparticles which average diameter is 10?nm and 1 728×10 -13 esu for 2～3?nm SnO 2 nanoparticles.Femtosecond time-resolved OKE measurements revealed that the response time of the optical nonlinearity in SnO 2/PVA thin film is extremely fast as short as 50?fs.更多还原