【摘要】 对多种纳米材料和纳米器件的噪声进行了比较详细的研究,对纳米器件中几种常用的噪声测量方法进行了探讨。讨论了利用噪声(主要是散粒噪声)进行介观电学机制探测的方法,并提出了用于解决单电子晶体管中背景电荷噪声的有效方法,揭示了双势垒共振隧穿二极管在负微分电阻区的散粒噪声大于Poisson值的本质。更多还原

【Abstract】 The noises in nanomaterials and nanoelectronic devices are analyzed,and their mea-surements are discussed.Shot noise measurement can be used as a tool to probe electronic pro-perties in mesoscopic systems.An effective method is invented to solve the background charge noise in single-electron transistor.Shot noise in the region of the negative differential resistance is larger than Poisson value in double barrier resonance diodes.更多还原