【摘要】 采用低压聚乙烯镶边垫底的粉末压饼法制样，Ｘ射线荧光光谱法直接测定了地质样品中痕量元素Ａｓ、Ｇａ、Ｓｃ、Ｌａ、Ｙ、Ｃｅ、Ｗ、Ｍｏ、Ｓｎ、Ｃｏ和Ｐｂ。讨论了背景校正、谱线重叠校正、基体效应校正和仪器漂移校正等问题。利用理论α系数代替经验系数，使方法具有较高的准确度和较低的检出限。所测１１个元素的检出限在（０．３０～２．０２）×１０－６水平，精度（ＲＳＤ，ｎ＝１１）在０．９５％～１３．０％。方法经国家一级标准物质分析验证，结果与标准值相符。更多还原

【Abstract】 A method for direct determination of trace As, Sc, Ga, La, Y, Ce, Pb, W, Mo, Sn, Co in geological samples by pressed powder pellet XRF was developed. The interferences from background, spectra overlap, instrumental drift, along with the methods for interference correction were discussed. It has been proved that detection limits and accuracy could be improved by replacing experienced coefficient calibration with theoretical α coefficient calibration method. The detection limits for 11 elements are (0.30?2.02)×10 -6 level and the precision of the method is 0.95%?13.0% RSD( n =11). The method has been verified by analysis of national standard reference materials with satisfactory results.更多还原