节点文献
四探针和双四探针法测量非晶态薄膜合金电阻的研究
Studies for Measuring the Resistance of Amorphous Film Alloy with the Four-point Probe and Two-four-point Probe Methods
【摘要】 研究了四探针和双四探针法测量非晶态薄膜合金电阻的几何尺寸效应,提出了一种高精度测量非晶态窄带薄膜合金电阻的新方法,理论和实验的研究结果都证明了这种方法的可行性。
【Abstract】 The effect of geometry size for measuring the resistance of amorphous film alloy with the four-point probe and two-four-point probe methods is studied A new method for measuring the resistance of amorphous narrow film alloy with high precision is introduced. The results of theory and experiment prove all the feasibility of this method.
- 【文献出处】 集美大学学报(自然科学版) ,JOURNAL OF JIMEI UNIVERSITY NATURAL SCIENCE , 编辑部邮箱 ,1998年01期
- 【分类号】O482.4
- 【被引频次】4
- 【下载频次】401