【摘要】 采用加速老化试验对光存储酞菁薄膜进行了寿命研究，以反射率的变化作为试验的判断依据。在５５℃，８５％ＲＨ；６５℃，８５％ＲＨ和７５℃，８５％ＲＨ的条件下，测试了反射率随时间的变化关系，用外推法估算出光存储酞菁薄膜的自然寿命。更多还原

【Abstract】 Methodology for determining extrapolated life expectancy values for phthalocyanine (Pc) thin films was investigated. The reflectivity was measured as a function of exposure time for media exposed to 55℃,85%RH, 65℃,85%RH, and 75℃,85%RH. The excellent stability of Pc thin films in studies of accelerated aging was reported.更多还原