节点文献
亚微米电子束曝光机激光工件台系统
Laser Stage System for Sub Micron E Beam Exposure Machine
【摘要】 介绍了正在现场使用的亚微米电子束曝光机激光工件台系统,详细论述了它的技术特征,分析了影响重复测量精度的误差因素,给出了系统各部分实际检测达到的技术指标。
【Abstract】 A laser stage system for sub micron E beam exposure machine which is being applied in the field at present is introduced in the paper.Its technical characteristics are described in detail,the error factors affecting the repeated measuring accuracy are analyzed,the technical specifications which have been attained in practical testing are given.
【关键词】 电子束曝光机;
精密定位;
工件台;
激光干涉仪;
【Key words】 Electron beam exposure devices; Precision positioning; Worktables; Laser interferometers.;
【Key words】 Electron beam exposure devices; Precision positioning; Worktables; Laser interferometers.;
【基金】 “八五”期间军工科技攻关
- 【文献出处】 光电工程 ,OPTO-ELECTRONIC ENGINEERING , 编辑部邮箱 ,1998年03期
- 【分类号】TH744.3,TN305
- 【被引频次】5
- 【下载频次】93