节点文献
0.8~1μm分步重复投影光刻机六自由度硅片定位系统设计与计算
Design and Calculation of 6 D Wafer Positioning System for 0.8-1μm Wafer Stepper
【摘要】 介绍用于0.8~1μm分步重复投影光刻机的六自由度硅片定位系统。讨论了气足、承片台系统及STAMP的设计和计算方法,并给出了设计数据与计算结果。本系统在X、Y1、Y2三个方向达到了±0.1μm(3σ)的重复定位精度、±50nm的调焦分辨力和5μm/全片的调平精度。
【Abstract】 A 6 D wafer positioning system used in 0.8~1μm wafer stepper is introduced in the paper.The air foot,wafer supporting stage system,the design and calculating methods of STAMP are discussed,the design data and calculating results are given.The system has realized ±0.1μm(3σ) repeat positioning accuracy in three directions of X,Y 1 and Y 2 ,±50nm focusing resolution and 5μm leveling accuracy for the whole wafer.
【关键词】 分步重复光刻机;
定位系统;
调焦机构;
调平机构;
【Key words】 Step and repeat photoetching machines; Position systems; Focusing mechanisms; Levelling mechanisms.;
【Key words】 Step and repeat photoetching machines; Position systems; Focusing mechanisms; Levelling mechanisms.;
【基金】 国家“八五”科技攻关项目
- 【文献出处】 光电工程 ,OPTO-ELECTRONIC ENGINEERING , 编辑部邮箱 ,1998年03期
- 【分类号】TN305
- 【被引频次】9
- 【下载频次】173