【摘要】 用适当的三维MonteCarlo技术模拟了较完整的单相材料正常晶粒长大过程，获得了晶粒长大动力学和拓扑学的全面信息、对正常晶粒长大的三维特征和相应的二维截面表征进行的对应分析表明：二维截面上测定的时间指数，具有和三维系统一致的随时间向稳态晶粒长大的理论值（n＝0.5）趋近的特征；由二维截面单位面积上的晶粒个数与时间的定量关系可以推断三维系统晶粒长大是否达到准稳态；二维截面上的晶粒尺寸分布不能代表真实的三维晶粒尺寸分布，也不能表征三维晶粒尺寸分布向一稳态分布函数演变的特征；晶粒在二维截面上的拓扑参数与三维空间的拓扑参数存在一定的统计学关系.更多还原

【Abstract】 An appropriate Monte Carlo method was developed to simulate the three-dimensional normal grain growth more completely comparative investigation on the three-dimensional characteristics and the cross-sectional expressions of normal grain growth indicated that the time exponent of grain growth determined from cross-section exhibits the same rule of increasing slowly with time and approaching the theoretical value n=0.5 of steady grain growth as the 3-D systemi from change of the number of grains per unit area measured in cross-section with time the state of three-dimensionaInormal grain growth may be predicted; the grain size distribution in cross-section is difFerent from that in three-dimensional system and cannot express the evolution characteristic of the three-dimensionaldistributioni there exists statisticat connection between the topological parameters in cross-section and those in three-dimensions.更多还原