【摘要】 本文通过把能量输运模型扩展到Ｆｅｒｍｉ统计情形，用数值方法研究了简并效应对半导体器件的热载流子输运的影响．对窄基区ＢＪＴ的模拟表明，当注入浓度很高时，载流子简并效应对热载流子输运的影响是不可忽略的更多还原

【Abstract】 Abstract The impact of degeneracy on the hot carrier transport is numerically studied by the extension of the energy transport model to the case of Fermi statistics. Simulation of a 50nm base BJT shows that if the injected carrier density is very high, the impact of degeneracy on the hot carrier transport can’t be ignored.更多还原