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纳米级PtSi/Si(111)膜成形工艺与连续性研究
Technological Study on Formation and Continuity of Nanometre-Level PtSi(111) Film
【摘要】 研究了在(111)Si衬底上沉积5nmPt膜经不同工艺成形后其反应产物及膜的连续性.结果表明高温短时间退火(600℃、3min)有利于形成连续的PtSi膜
【Abstract】 Abstract The constitution and continuity of PtSi(111) films formed by evaporating 5nm Platinum film on Si(111) substrates, and then, annealed at different temperatures, are studied.The results show that the technology with a high temperature and short time annealing (600℃、3min) is favorable to form a continuous nanometre-level PtSi film.
- 【文献出处】 半导体学报 ,CHINESE JOURNAL OF SEMICONDUCTORS , 编辑部邮箱 ,1998年06期
- 【分类号】O484.5,TN304.055
- 【被引频次】5
- 【下载频次】23