节点文献
InAs薄膜Hall器件的材料生长与特性研究
Growth and Study of InAs Thin Films for Hall Effect Devices
【摘要】 本文在国内首次报道了利用InAs外延薄膜制作霍尔器件,通过分子束外延技术在GaAs衬底上生长的InAs薄膜具有较高的迁移率和较好的温度特性.用这种材料制作的霍尔器件在每千欧姆内阻条件下灵敏度与GaAs平面Hal器件相比提高了50%.
【Abstract】 Abstract This paper reports InAs thin films grown on GaAs (001) substrates by Molecular Beam Epitaxy(MBE) with good crystal quality, high electron mobility and small temperature dependence. Hall effect devices with sensitivity 50% higher than GaAs planar Hall effect devices are produced using these films.
- 【文献出处】 半导体学报 ,CHINESE JOURNAL OF SEMICONDUCTORS , 编辑部邮箱 ,1998年06期
- 【分类号】TN382.04,TN304.230
- 【被引频次】6
- 【下载频次】112