【摘要】 Ｅａｒｌｙ电压ＶＡ和直流增益β是双极器件在模拟电路中应用的重要参数，本文研究了在器件不发生大注入效应和雪崩倍增效应的条件下，ＳｉＧｅＨＢＴ中基区Ｇｅ含量以及ＶＣＥ对器件的Ｅａｒｌｙ电压ＶＡ的影响，并用数值计算的方法得到了在其它参数相同的情况下，器件的Ｅａｒｌｙ电压ＶＡ随基区中Ｇｅ含量和偏置电压ＶＣＥ的变化规律，表明Ｅａｒｌｙ电压ＶＡ是随ＶＣＥ和Ｇｅ含量的增加而增加的．这些结果对ＳｉＧｅＨＢＴ在模拟集成电路中的设计和应用提供了指导．更多还原

【Abstract】 Abstract The effects of device bias V CE and Ge content in SiGe base on Early voltage of Si 1- x Ge x HBT are studied by numerical analysis without considering the influence of high level injection effect and impact ionization of carriers. With other parameters unchanged, Early voltage V A and current gain β of SiGe HBT increase with the increase of device bias V CE and Ge content in base. The results are useful for the design of SiGe HBT used in analog integrated circuit.更多还原