节点文献

与Si集成的溶胶-凝胶法制备的TiO2-SiO2复合薄膜的应力分析

Study of Stress in SolGel Coating TiO2SiO2 Composite Thin Films Formed on Si Substrate

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 翟继卫; 杨银堂; 张良莹; 姚熹;

【Author】 Zhai Jiwei Yang Yintang Zhang Liangying Yao Xi(Electron Materials Research Laboratory,Xi′an Jiaotong University,Xi′an 710049)

【机构】 西安交通大学电子材料研究所;

【摘要】 采用激光束反射偏转法测量了用溶胶-凝胶法在Si(111)基片上制备的TiO2-SiO2复合薄膜的曲率半径。由此计算出薄膜的热应力、应力和本征应力。研究了工艺过程与薄膜应力的关系,其应力随热处理温度的增加而由张应力转变为压应力;当热处理温度较低时,随膜厚的增加,其应力增大,而最终导致膜的开裂。薄膜的最大不开裂厚度随热处理温度和TiO2含量的增加而增加。

【Abstract】 The stress in the TiO2SiO2 solgel coatings on Si substrate was investigated by a laser reflectance technique.The relation between technological process and thin film stress(including stress σf,intrinsic stress σi and stress σth) was studied.The tensile stress was decreased and transformed into compressive stress as the annealing temperature increase. At lower temperature,the stress increased as the thickness increased and consquently caused cracking of the film.A critical thickness of the film was increased as the TiO2 content and annealing temperature increase.

  • 【文献出处】 半导体技术 ,SEMICONDUCTOR TECHNOLOGY , 编辑部邮箱 ,1998年03期
  • 【分类号】TN304.055,O484.2
  • 【被引频次】1
  • 【下载频次】90
节点文献中: 

本文链接的文献网络图示:

本文的引文网络