【摘要】 首次将脉宽调制控制芯片（ＵＣ３５２５）用于激光扫描测量系统，解决了激光扫描测量中因不同材料对激光的散射光强不同、不同曲面对激光光强反射各异以及物体表面镜面反射等问题给测量精度带来的严重影响［１］，利用激光扫描系统中的摄像机直接作为光强反馈系统，实现了测量过程中的光强自动控制，有效地降低了光强饱和等问题给测量带来的误差。更多还原

【Abstract】 UC3525 is used for the laser scanning measuring system for the first time.With this system the effects caused by such factors as the different laser scattering intensity for different materials,the varying laser intensity reflection for distinct curved surfaces,and the mirror reflection of the object surface can be eliminated.Light intensity is auto-controled during the process of measurement by using a camera in the laser scanning system as a light intensity feedback system ,so that the error caused by such factors as intensity saturation can be effectively reduced.更多还原