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酚醛树脂固化度的X射线衍射分析

X-ray Diffraction Analysis of the Curing Degree of Phenolic Resin

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【作者】 金春玲徐辉钟守仁

【Author】 Jin Chunling (Beijing Satellite Plant Beijing 100081) Xu Hui (Aerospace Research Institute of Materials and Processing Technology Beijing 100076)

【机构】 北京卫星制造厂!北京100081航天材料及工艺研究所!北京100076

【摘要】 发展使用X射线衍射技术对酚醛树脂固化度进行研究,确定了酚醛树脂固化度与X射线散射最大值的关系,得出了利用2θ角来标定树脂团化度的公式。该方法具有快速、无损、灵敏度高的优点,并可适用于各种不同的酚醛树脂。

【Abstract】 This paper presents a study of the curing degree of phenolic resin by X-ray diffrac-tion analysis technique. Relationship between the curing degree of phenolic resin and maximum X-ray scattering value has been defined- A formula of the curing degree of phenolic resin, calibrated by scattering angle 20, has been obtained. This method has the advantage of quickness, nonde-struction and hige sensitivity. This method can also be used in other kinds of phenolic resin.

  • 【文献出处】 宇航材料工艺 ,AEROSPACE MATERIALS & TECHNOLOGY , 编辑部邮箱 ,1997年02期
  • 【分类号】TB32
  • 【被引频次】4
  • 【下载频次】287
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