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酚醛树脂固化度的X射线衍射分析
X-ray Diffraction Analysis of the Curing Degree of Phenolic Resin
【摘要】 发展使用X射线衍射技术对酚醛树脂固化度进行研究,确定了酚醛树脂固化度与X射线散射最大值的关系,得出了利用2θ角来标定树脂团化度的公式。该方法具有快速、无损、灵敏度高的优点,并可适用于各种不同的酚醛树脂。
【Abstract】 This paper presents a study of the curing degree of phenolic resin by X-ray diffrac-tion analysis technique. Relationship between the curing degree of phenolic resin and maximum X-ray scattering value has been defined- A formula of the curing degree of phenolic resin, calibrated by scattering angle 20, has been obtained. This method has the advantage of quickness, nonde-struction and hige sensitivity. This method can also be used in other kinds of phenolic resin.
【关键词】 酚醛树脂;
固化度;
X射线衍射;
散射最大值;
【Key words】 Phenolic resin; Curing degree; X-ray diffraction; Maximum scattering value;
【Key words】 Phenolic resin; Curing degree; X-ray diffraction; Maximum scattering value;
- 【文献出处】 宇航材料工艺 ,AEROSPACE MATERIALS & TECHNOLOGY , 编辑部邮箱 ,1997年02期
- 【分类号】TB32
- 【被引频次】4
- 【下载频次】287