【摘要】 对硅熔体的基本物理性质，密度、表面张力、粘度的最新实验结果进行了综述．发现在硅的熔点（约为１４１５℃）以上１５—２０℃的温区内存在明显的异常变化现象．这些最新实验结果与过去的文献报道值相差甚远．如：密度大２—３％，表面张力小２０—３０％，粘度大４０％．在熔点附近，熔体的密度和表面张力是杂质的敏感量．硅熔点附近物理性质的这些异常变化，认为是由于硅原子结构状态的变化而引起的更多还原

【Abstract】 A review is presented of recent experimental results about the physical properties of silicon melt such as density, surface tension and viscosity. It is found that there is an obvious anomaly of the physical properties at a temperature of about 15—20℃ above the melting point of silicon. The results also show that these features differ greatly from those reported in the past literature. The density and surface tension are impurity sensitive near the melting point. These anomalous physical properties of silicon melt seem to result from the structural variation of the melt.更多还原