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V2O5薄膜电荷储存特性研究
Investigation of Charge Storage Properties in V2O5 Thin Films
【摘要】 本文采用真空蒸发制备了V2O5薄膜,用电化学方法从Li离子电解质中向V2O5薄膜注入Li离子.研究了V2O5薄膜中Li离于储存特性、注入/退出可逆性以及电荷注入对其光学性能的影响.实验结果表明,V2O5薄膜具有较好的Li离子储存特性和注入/退出可逆性,Li离子的注入量受到膜中V5+的含量以及锂离子可占据的总位置数限制,而且离子注入后V2O5薄膜的光学性能变化较小.
【Abstract】 Lithium was inserted electrochemically from an electrolyte into V2O5 thin films prepared by evaporation and posttreated at different temperatures in air so that LixV2O5 was obtained. Li+storage properties, reversibiliy of Li+ intercalation/deintercalation in V2O5 thin films and influence of Li+ insertion on their optical properties were investigated. The experimental results show that two factors, the V5+ concentration and the sum total of sites in V2O5 thin films, control the capacity of Li+ insertion into V2O5 thin films, and that these thin films have a good Li+ storage characteristic, stability and reversibility.
- 【文献出处】 无机材料学报 ,JOURNAL OF INORGANIC MATERIALS , 编辑部邮箱 ,1997年04期
- 【分类号】O484
- 【被引频次】17
- 【下载频次】123