节点文献
波导测量中介质参量与试样厚度的关系
The Relationship between the Dielectic Parameter and the Specimen Thickness in Waveguide Measurement
【摘要】 本文给出一种波导测量系统.在稳频、稳幅及电路匹配条件下,对介质参量进行测量,得出短路.开路情况下的反射系数振幅|F|与试样厚度D/λg的关系曲线。通过误差分析,找出准确测量介质参量所需的样厚度。
【Abstract】 The waveguide measurement system is presented in the paper. Under the conditionof stabilized frequency. amplitude and Circuit matching the dielectric parameters are measured, Inthe case of open circuit and short circuit. the relationship between amplitude of reflectioncoefficient |T| and specimen thickness d/λg is given. By means of error analysis the specimenthickness is found out for accurately measuring dielectric parmeters.
- 【文献出处】 微波学报 ,JOURNAL OF MICROWARES , 编辑部邮箱 ,1997年04期
- 【分类号】TN25
- 【被引频次】3
- 【下载频次】47