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用扫描电镜直接观察变形材料中的位错结构──[001]取向铜单晶疲劳位错结构的研究
DIRECT OBSERVATION OF DISLOCATION STRUCTURE IN DEFORMED MATERIALS BY SEM──Dislocation Structure in a Fatigued [001] Cu Single Crystal
【摘要】 用扫描电镜(SEM)的电了通道讨度(ECC)技术研究了[001]取向铜单晶中的疲劳位错结构结果表明,SEMECC技术不仅可以真实地、全面地显示疲劳位错组态,而且还揭示了表面出现的宏观形变带与位错结构的对应关系.
【Abstract】 The dislocation configuration in a fatigued [001] copper single crystal has beenstudied by using a scanning electron microscope (SEM) with the electron channeling contrast(ECC) technique. It has been shown that this unique technique is efficient to reveal not onlythe fatigue dislocation structures in a large scale but also the relationship between the surfacedeformation bands and inside dislocation structures. It has been proven to be a powerful toolto connect macrostructures and microstructures in fatigued materials.
【关键词】 扫描电镜;
电子通道衬度技术;
铜单晶体;
位错结构;
【Key words】 :scanning electron microscope; electron channeling contrast; copper single crystal; dislocation structure;
【Key words】 :scanning electron microscope; electron channeling contrast; copper single crystal; dislocation structure;
【基金】 国家自然科学基金!19392300-4
- 【文献出处】 金属学报 ,ACTA METALLRUGICA SINICA , 编辑部邮箱 ,1997年06期
- 【分类号】TB30
- 【被引频次】8
- 【下载频次】334