【摘要】 用扫描电镜（SEM）的电了通道讨度（ECC）技术研究了[001]取向铜单晶中的疲劳位错结构结果表明，SEMECC技术不仅可以真实地、全面地显示疲劳位错组态，而且还揭示了表面出现的宏观形变带与位错结构的对应关系.更多还原

【Abstract】 The dislocation configuration in a fatigued [001] copper single crystal has beenstudied by using a scanning electron microscope (SEM) with the electron channeling contrast(ECC) technique. It has been shown that this unique technique is efficient to reveal not onlythe fatigue dislocation structures in a large scale but also the relationship between the surfacedeformation bands and inside dislocation structures. It has been proven to be a powerful toolto connect macrostructures and microstructures in fatigued materials.更多还原