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激光诱导薄膜损伤的缺陷统计模型与光斑效应
The Defect statistical Model of Pulse Laser-induced Damage to Thin-film and Spotsize Effocts
【摘要】 讨论了脉冲激光诱导薄膜损伤的缺陷统计模型,在对该模型加些适当的限制条件后,运用它解释光斑效应,发现该理论模型与实验结果符合得很好。
【Abstract】 The defect statistical model of pulse laser induced damage to thin-film are discussed. After some appropriate limited conditions are given to the model, we use it to interpret spotsize effects, we find the theory model fits experimental data very well.
【关键词】 指数律缺陷损伤集合体;
损伤概率;
损伤阈值;
光斑效应;
【Key words】 the power law defect damage ensemble; probability of damage; damage threshold; spotsize effects;
【Key words】 the power law defect damage ensemble; probability of damage; damage threshold; spotsize effects;
【基金】 中国工程物理研究院行业科技预研基金
- 【文献出处】 激光与红外 ,LASER & INFRARED , 编辑部邮箱 ,1997年05期
- 【分类号】TN241
- 【被引频次】4
- 【下载频次】77