节点文献
硫化锌薄膜的制备和结构分析
Preparation and Structure Analysis of Zinc Sulfide Thin Film
【摘要】 用常规分舟热蒸发法在玻璃衬底上制备硫化锌薄膜,用X射线衍射和透射电子显微镜研究该薄膜的晶体结构,发现硫化锌薄膜与流化锌粉末在晶体结构上存在差异,实验证实硫化锌晶体是具有高于性的共价键晶体。
【Abstract】 The zinc sulfide thin films have been prepared on glass substrate by thermal evaporation with two separate boats in vacuum. After studing the films with X-ray diffraction (XRD) and transmission electron microscope (TEM), structures of the film and the powder of ZnS are found to be different. The experimental results indicate that the crystalline of the zinc sulfide is the one of covalent bond with ionicity.
【关键词】 硫化锌薄膜;
X射线衍射;
透射电镜;
【Key words】 ZnS Thin Film; X-ray Diffraction; Transmission Electron Microscope;
【Key words】 ZnS Thin Film; X-ray Diffraction; Transmission Electron Microscope;
【基金】 福建省自然科学基金
- 【文献出处】 固体电子学研究与进展 ,RESEARCH & PROGRESS OF SOLIA STATE ELECTRONICS , 编辑部邮箱 ,1997年04期
- 【分类号】TN304
- 【被引频次】7
- 【下载频次】486