节点文献
多孔硅反射谱的测量与分析
The Measurement and Analysis of the Optical Reflectance Spectra of PS
【摘要】 测量了多孔硅的光反射谱,并进行了分析和讨论,得出了其能带展宽等特性。利用K-K关系,计算得出了多孔娃的折射率n等光学常数,并结合单晶硅的相应光学常数进行了比较和分析.
【Abstract】 The optical reflectance spectra of PS is measured and analyzed. The result shows that the bandgap of PS has been broadened. Index of refraction n and other optical constants of PS are obtained by calculation with the Kramers-Kroning relation. A comparison between the optical constants of PS and that of crystal sili-con is made.
- 【文献出处】 固体电子学研究与进展 ,RESEARCH & PROGRESS OF SOLIA STATE ELECTRONICS , 编辑部邮箱 ,1997年01期
- 【分类号】TN304
- 【被引频次】3
- 【下载频次】116