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亚纳米级超精细表面微观形貌光电测量技术的现状与发展

The Development Situation of the Laser-interference Measurement with Subnanometer Resolution for Measuring the Microprofile of Ultraprecision Surface

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【作者】 周肇飞周卫东王世华迟桂纯

【Author】 Zhou Zhaofei et al

【机构】 四川联合大学测控系!成都610065

【摘要】 通过对亚纳米级超精细表面微观形貌光电测量技术发展现状的介绍,着重阐述了激光差动干涉到同轴式激光表面微观测量的原理,对四种典型同轴式激光轮廓仪的特点以及影响表面微观形貌测量精度和限制测量分辨率的因素进行了分析,介绍了作者关于同轴式激光轮廓仪运用到超精加工金刚石车床上进行纳米级微观形貌在线检测的研究成果。

【Abstract】 The development situation of the optical-electronic measurment of the surface microprofile wilh subnanometer resolution is described, Emphatically point out the measuring principle of coaxial interference profilometer as well as the features of four typical coaxial profilometers, the influence affects of their resolution and accuracy are analyzed.Introduced our research achievement of the on-machine measuring instrument, which is used on the diamond lathe to measure the microprofile of machining surface with subnanometer resolution.

【基金】 国家自然科学基金
  • 【分类号】TH74
  • 【被引频次】1
  • 【下载频次】146
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