【摘要】 阐述了ＩＣＰ－ＡＥＳ专家系统中ＡＥＳ电离和激发模型的基本原理，研究了模拟中应用ｎｏｎ－ＬＴＥ理论的正确性以及所需的支持数据库。利用 Ｂｏｌｔｚｍｎａｎｎ曲线，讨论了 Ｂｏｌｔｚｍａｎｎ温度的测量值随能级激发能而变化的现象，并与类似条件下的实验Ｂｏｌｔｚｍａｎｎ曲线进行了对比，证明了专家系统中ＡＥＳ电离和激发模型的可靠性。更多还原

【Abstract】 The fundamental principle of atbmic ionization and excitation models applied in ICP-AES primary expert system was described. The validity of non--LTE processes and nec- essary databases was demonstrated. Boltzmann plots of Ca and Mg with non-LTE simulation showed that the Boltzmann temperature might not be represented with only one value. The reliability of the established AES excitation model has been proved by the comparison with experimental Boltzmann plots.更多还原