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多离子束反应共溅射制备PbTiO3铁电薄膜的微结构研究
Research on Microstructure of Lead Titanate Thin Films Prepared by Multi Ion Beam Reactive Cosputtering
【摘要】 本文利用多离子束反应共溅射装置,分别在Si和MgO衬底上原位制备了PbTi氧化物薄膜。研究表明,利用多离子束反应共溅射技术,可以显著降低薄膜后续热处理的温度;薄膜中焦绿石结构的消失温度与薄膜中Pb的含量有关;较之Si衬底,在MgO衬底上的薄膜较易获得好的晶体结构和优良的薄膜表面形貌。对所观察到的现象,从衬底与薄膜相互作用的角度进行了讨论
【Abstract】 In this paper, lead Titanate thin films were fabricated on Si(111) and MgO(100) by multi ion beam reactive cosputtering technique. By using this technique, we found that perovskite PT thin films appears at lower temperature, and the temperature at which pyrochlore phase disappears was connected with lead content, and the microstructure of PT thin films prepared on MgO was better than that on Si. These phenomena were interpreted according to thin films growth theory and the interaction between substrate and thin film.
【关键词】 多离子束反应共溅射;
焦绿石;
钙钛矿;
【Key words】 multi ion beam reactive cosputtering\ pyrochlore\ perovskite;
【Key words】 multi ion beam reactive cosputtering\ pyrochlore\ perovskite;
- 【文献出处】 电子显微学报 ,JOURNAL OF CHINESE ELECTRON MICROSCOPY SOCIETY , 编辑部邮箱 ,1997年04期
- 【分类号】O484.42
- 【下载频次】30