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含氧量对NiO_x薄膜光电特性的影响

THE PHASE TRANSITION AND PHOTOELECTRONIC PROPERTIES OF NiO_x THIN FILMS

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【作者】 傅竹西林碧霞韩宪泽廖桂红

【Author】 FU Zhuxi; LIN Bixia; HAN Xianzhe; LIAO Guihong (University of Science and Technology of China)

【机构】 中国科技大学

【摘要】 采用直流溅射方法制备了厚度小于0.1μm的NiOx薄膜,研究薄膜的加热氧化及其光电特性,测量了它们的透射光谱和电阻率随薄膜中的氧含量及热处理温度的变化

【Abstract】 The thin films of NiOx, which thickness smaller than 0.1μm,were prepared by reactive sputtering of a Ni target with a mixed gas of argon and oxygen. The samples then were heated in air. It was found that the transmissivity and conductivity of the samples markedly changed with the heated temperature.According to the XRD partten these changes are due to the phase transition from metal to oxide, but also related to the crystallinity of the films. The relationship of the phase transition with the heated temperature and the oxygen content of the samples are discussed.

  • 【文献出处】 材料研究学报 ,CHINESE JOURNAL OF MATERIAL RESEARCH , 编辑部邮箱 ,1997年02期
  • 【分类号】O484
  • 【下载频次】46
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