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亚微米聚焦离子束溅射刻蚀的实验研究
EXPERIMENTAL STUDY ON THE SUB-MICRON FOCUSED ION BEAM ETCHING FABRICATION
【摘要】 简要介绍了自制的聚焦离子束(FIB)系统中束着靶点的飘移现象,分析引起飘移的原因及所采取降低飘移的措施。用此FIB进行了一些基本图形的刻蚀研究,讨论了束流密度分布对溅射刻蚀线条宽度的影响。最后介绍了用FIB制作光电集成电路的谐振腔面和耦合腔的一些经验。
【Abstract】 The beam drift phenomenon in the focused ion beam(FIB) system made byourselves are briefly introduced and the factors causing the drift amd measures toreduce the drift are discussed. Then we described the experimental study of theFIB etching fabrication for some basic graphes. The effect of the beam currentdensity distribution upon the etched line width is discussed. In the end,someexperiences to fabricate the output mirror of ridge wave guide GaAs/GaA1Asquantum wells laser and the coupled-cavity of GaAs/GaA1As multiple quantumwells wave guide modulator/laser monolithically integrated light source by FIBsputter-etching are given.
- 【文献出处】 微细加工技术 ,MICROFABRICATION TECHNOLOGY , 编辑部邮箱 ,1996年02期
- 【分类号】TN305.7
- 【被引频次】13
- 【下载频次】146