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Pt/Ti电极的扩散行为及其对铁电薄膜的影响

The Diffusion Behavior of Pt/Ti Electrode and Its Effect on Ferroelectric Thin Films

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【作者】 屈新萍丁爱丽罗维根仇萍荪陈先同

【Author】 Qu Xinping;Ding Aili;Luo Weigen;Qiu Pingsun;Chen Xiantong(Shanghai Institute of Ceramics,Chinese Academy of Sciences Shanghai 200050 China)

【机构】 中国科学院上海硅酸盐研究所

【摘要】 采用直流磁控溅射方法制备Pt/Ti电极,用RBS、XRD、SEM方法研究了Pt和Ti的扩散行为,发现在氧气氛中进行热处理造成Ti层的快速氧化,Ti厚度对Pt/Ti的扩散有很大影响.Pt/Ti的扩散造成其上的铁电薄膜较差的显微结构和性能.

【Abstract】 Pt/Ti electrode was prepared by DC magnetron sputtering. Interdiffusion in the Pt/Ti/SiO2/Si interface was examined as a function of various annealing conditions and substrate heating temperatures by using Rutherford backscattering spectrometry, X-ray diffraction and scanning electronic microscopy. It was found that annealing in O2 atmosphere caused the rapid oxidation of Ti layer. The thickness of Ti layer was very important to the interdiffusion of Pt/Ti electrode. The interdiffusion of Pt/Ti caused the poor microstructure and properties of ferroelectric thin films.

【基金】 “863”新材料专家委员会资助
  • 【文献出处】 无机材料学报 ,JOURNAL OF INORGANIC MATERIALS , 编辑部邮箱 ,1996年03期
  • 【分类号】TQ151.15
  • 【被引频次】22
  • 【下载频次】141
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