【摘要】 开发了一种新的单元库电路性能参数自动提取技术。给出了该技术提取流程结构框图，详细阐述了输入电容的自动提取、库单元的行为功能、电路模拟输入文件的产生及计算结果的处理。实际电路的实现证明了该技术的可行性和实用性更多还原

【Abstract】 A new technique has been developed to extract circuit parameters for submicron cell libraries.The extracting process is illustrated.The automatic extraction of input capacitance parameters,the behavioural function of cells in the library,the generation of the input files for circuit modeling and the processing of computing results are described in detail.This new technique has been verified for its feasibility and practicability by the implementation of an actual circuit.更多还原