【摘要】 介绍了熔点下降薄层比较法的原理、计算方法和测量时需注意的问题。熔点下降薄层比较法测定纯度具有可靠的热力学基础,改进的Smit装置测温准确可靠,测定的纯度具有溯源性。更多还原

【Abstract】 This paper describes the general principle, calculus for thin film comparative method of cryoscopy,and concerned problems in the measure. The thin film comparative method of cryoscopy determines purity of organic compounds,which has reliable thermodynamic basis. The improved Smit apparatus measuring temperature is accurate,reliable. Determining the purity of organic compounds has traceability.更多还原