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长焦距光学系统杂光系数测试仪
THE DEVICE FOR THE MEASUREMENT OF THE VEILING GLARE INDEX OF LONG FOCAL OPTICAL SYSTEM
【摘要】 报告了一种新的长焦距光学系统杂光系数测量装置,该装置除具有避免了制作大直径积分球的优点外,还能精确测量轴外杂光系数,分析各部分杂光源对杂光系数的影响。
【Abstract】 This paper presents a new device for measuring the veiling glare index of long focal lengthoptical system. The device can make the precise measurements of veiling glare index at an extra-axialobject point and analyze the influence of each stray light source on the veiling glare index as well asavoiding making the large diameter integrating sphere.
【关键词】 长焦距光学系统;
杂光系数;
杂光源;
【Key words】 Long focal length optical system; Veiling glare index; Stray light sources;
【Key words】 Long focal length optical system; Veiling glare index; Stray light sources;
- 【文献出处】 光子学报 ,ACTA PHOTONICA SINECA , 编辑部邮箱 ,1996年06期
- 【分类号】O435.2
- 【被引频次】9
- 【下载频次】185