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陶瓷阻力曲线测定的新方法──断裂栅法

A NEW METHOD FOR DETERMINING THE R-CURVE OF CERAMICS- FRACTURE GRATING METHOD

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【作者】 石玲戴福隆蒋小林

【Author】 Shi Ling; Dai Fulong; Jiang Xiaolin(Department of Engineering Mechanics, Tsinghua University, Beijing ,100084)

【机构】 清华大学工程力学系

【摘要】 将零厚度单向试件栅刻蚀工艺应用于晶须增韧氮化硅陶瓷基复合材料表面。通过记录试件所在桥路的输出电压值,可得到随载荷不断增大裂纹逐渐向前扩展过程中每一时刻的裂尖位置和裂纹长度,从而得到该种材料的阻力曲线.

【Abstract】 The etching technique of the single-lined zero-thickness specimen grating is applied on the surface of the fiber toughening Si3N4 ceramic composite specimen. The position of the crack and the crack length during the process of-crack extension when the load is applied and gradually increased can be determined by recording the output voltage value of the wheatstone bridge in which the ceramic specimen with the fracture grating on is located. The crack - growth- resistance (R-curve)of this material is thus obtained.

  • 【文献出处】 固体力学学报 ,ACTA MECHANICA SOLIDA SINICA , 编辑部邮箱 ,1996年04期
  • 【分类号】TQ174.758
  • 【下载频次】43
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