节点文献
软基底薄膜热敏电阻器的失效分析
Research on Failure Analysis of Flexible Substrate Thin-film Thermistor
【摘要】 对软基底薄膜热敏电阻器的可靠试验进行了研究,由试验数据找出失效原因,并提出改进措施。
【Abstract】 Reliability test of flexible substrate thin-film thermistor is researched. The reasons of failure from the testing date are found and improved advices are pointed out.
【关键词】 薄膜热敏电阻器;
软基底;
可靠性;
失效分析;
【Key words】 Thin-film thermistor Flexible substrate Reliability Failure analysis;
【Key words】 Thin-film thermistor Flexible substrate Reliability Failure analysis;
【基金】 “八五”国家重点科技攻关项目
- 【文献出处】 传感器技术 ,JOURNAL OF TRANSDUCER TECHNOLOGY , 编辑部邮箱 ,1996年06期
- 【分类号】TP212
- 【下载频次】76