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硅基上直流反应磁控溅射沉积优质ZnO薄膜及其性能研究
Preparation and Characterization of High-Quality ZnO Film on Silicon Substrate by DC Reactive Magnetron Sputtering
【摘要】 本文报道采用改进的磁控S枪,利用直流反应磁控溅射技术,通过合理地控制调节,已成功地在硅衬底上制备出C轴取向高度一致的ZnO纳米级材料,其X射线衍射半高宽仅为0.7°.在用XRD,XPS等手段对其成份、结构分析的基础上,进一步对其反应溅射过程进行了研究.
【Abstract】 Abstract High-quality 2nO films were prepared on silicon substrate by DC reactive magnetron sputtering. The films were characterized by X-ray Photoelectron Spectroscopy(XPS)and X-ray Diffraction(XRD) analysis. The nano-ZnO films grow at C axis orientation and the full width at half maxium (FWHM) is only about 0. 7°.
- 【文献出处】 半导体学报 ,CHINESE JOURNAL OF SEMICONDUCTORS , 编辑部邮箱 ,1996年11期
- 【分类号】TN304.25
- 【被引频次】36
- 【下载频次】180