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薄膜全耗尽SOI MOSFET单晶体管Latch效应
The Single Transistor Latch Effect of Thin Film Fully Depleted SOI MOSFET
【摘要】 本文在详细分析各种不同条件下全耗尽MOSFET单晶体管Latch效应测试结果的基础上,较为详细地讨论了单晶体管Latch效应的物理机理,发现单管Latch效应与MOSFET的寄生双极晶体管有着极其密切的关系,最后还给出了相应的改进措施。
【Abstract】 On the basis of the analysis ofmeasurement results offulldepletedMOSFET, the mechanism of single transistor latch effect was detailed to discuss. The single transistor latch effect is causedbythe parasitic bipolar transistor. At last, the methods to reduce the latch effect was obtained.
- 【文献出处】 微电子学与计算机 ,MICROELECTRONICS & COMPUTER , 编辑部邮箱 ,1995年02期
- 【分类号】TN401
- 【被引频次】2
- 【下载频次】81