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表面增强电输运:研究C₆₀-金属相互作用的一个新尝试

SURFACE-ENHANCED ELECTRONIC TRANSPORT: A NEW APPROACH TO PROBE THE INTERACTIONS BETWEEN C₆₀ AND NON-ALKALI-METALS

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【作者】赵文兵；吴军桥；张晓东；叶志远；吴克；张金龙；李传义；尹道乐；顾镇南；周锡煌；金朝霞；

【Author】 ZHAO WEN-BING Wu JUN-QIAO ZHANG XIAO-DONG YB ZHI-YUAN Wu KB ZHANG JIN-LONG LI CHUAN-YI YIN DAO-LE(Department of Physics, Pcking University, Beijing 100871)Gu ZHEN-NAN Hou XI-HUANG JIN ZHAO-xiA(Deportment of Chemistry, Peking University, Beijing 100871)

【机构】北京大学物理系；北京大学化学系；北京大学化学系北京100871；北京100871；

【摘要】通过在超薄金属层上蒸镀C₆₈时的电阻原位测量,发现在平均厚度约一个C₆₈单层范围内样品电阻有明显可观测的变化,主要表现为电导增强,电阻变化的程度与金属层厚度有关,最多近一个数量级。这一新的现象揭示出有可能利用宏观物理性质测量来间接研究C₆₈-金属界面相互作用,从而对常规喇曼谱和各种电子谱测量的结果给出旁证和补充。更多还原

【Abstract】 By measuring the resistance in situ during the deposition of C60 on ultrathin metal layers in UHV system, we find the resistance decreases sharply at most cases. This enhanced electronic transport in metal-C60 multilayers (bilayers), may be rela-ted to the charge transfer of metal to C60 and surface bonding effects, hence can be used as a new possible approach to probe the interfacial interactions between C60 and metals.更多还原