【摘要】 用弹道电子发射显微镜对Au/n-Si（100）界面势垒测试,直接得出定点的势垒特性和纳米尺度的界面图象.通过所测的I_c-V曲线,可得所测点的肖特基势垒高度及电荷传输特性.界面图象可以显示界面极小范围内势垒的特性.更多还原

【Abstract】 The Au/n-Si(100) interface system has been studied by the ballistic electron emission microscopy (BEEM). The barrier heights at different positions of the interface and interface images have been directly obtained with nanometer-scale resolution. Schottky barrier heights and electronic transmission properties of the interface are deduced from Ic-V curves. The BEEM images reveal the properties of barrier in very small regions at the interface.更多还原