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AT细胞DNA双链断裂重接修复效率及其忠实性

The Repair Efficiency and Fidelity of DNA Double-strand Break Rejoning in AT Cells

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【作者】 周平坤项晓琼刘学英夏寿萱

【Author】 Zhou, Ping-Kun; Xiang, Xiao-qiong; Liu, Xue-ying; Xia, Shou-Xuan (Institute of Radiation Medicine, Beijing 1000850)

【机构】 北京放射医学研究所

【摘要】 用脉冲电场凝胶电泳和双标记基因质粒DNA转染技术研究辐射敏感的毛细血管扩张性共济失调症患者皮肤成纤维细胞(AT5BIVA)和正常辐射抗性的人宫颈癌细胞(HeLaS3)DNA双链断裂重接修复率及其忠实性。结果表明γ射线照射诱发DNA双链断裂的产额和重接修复率,在两株细胞间无差别.而AT细胞对导入的限制性内切酶EcoRV产生双链断裂质粒DNA的重接修复忠实性显著低于HelaS3te胞,表明AT细胞易发生DNA错误修复,这很可能就是AT细胞高度辐射敏感性的主要原因。

【Abstract】 The repair efficiencies of DNA double-strand break rejoining were assessed in radiation-sensitive ATSBIVA cells and radioresistance HeLa S3 cells by pulsed field gel electrophoresis. DNA errorprone repair was considered probably to be the main cause of hypersensitivity to gamma radiation in AT cells. The results indicated that the intial production and the rejoining efficiency of ionizing radiationinduced DNA double-strand breaks were similar in two cell lines.However. ATSBIVA cells showed a significantly reduced fidelity of rejoining DNA double-strand breaks cut by restriction endonuclease EcoR V in transferred vector DNA. The plasmid dublemarked with neo and gpt genes was transfered into both kinds of cells and the fidelity of DNA double-strand break rejoining was examined

【基金】 国家自然科学基金
  • 【分类号】Q26
  • 【被引频次】5
  • 【下载频次】59
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