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阳极溶出伏安法测定KH2PO4中痕量的Sn（Ⅳ）
DETERMINATION OF MICRO-AMOUNT OF Sn（Ⅳ）IN KH2PO4 BY ANODIC STRIPPING VOLTAMMETRY
【摘要】 讨论了在伏安法中ＫＨ２ＰＯ４（ＫＤＰ）对测定Ｓｎ（Ⅳ）的影响并采用１．５次导数阳极溶出伏安法测定了ＫＤＰ中痕量Ｓｎ（Ⅳ），检测下限为９×１０－９ｍｏｌ／Ｌ，回收率达９８～１０８％．
【Abstract】 The influence of KH2PO4(KDP) to the determination of Sn (Ⅳ) by voltammetry was discussed. 1. 5-order derivative anodic stripping voltammetry was used to determine the Sn (Ⅳ ) in KDP and a detection limit of 9×10-9mol/L can be obtained. The recovery of the method was 98～108%.
【基金】 山东大学晶体材料实验室资助
- 【文献出处】 山东大学学报(自然科学版) ,Journal of Shandong University(Natural Science Edition) , 编辑部邮箱 ,1995年04期
- 【分类号】O657.1
- 【下载频次】29