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金属镀层镀布量的X射线荧光测定

Determination of Metal Plating Mass Thickness by X Ray Fluorescence Method

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【作者】 谢东孟丽云刘鸣

【Author】 Xie Dong Meng Liyun (Department of Physics,Hebei Normal University,Shijiazhuang,050016)Liu Ming (Hehei Hengshui TV University,053000)

【机构】 河北师范大学物理系河北衡水市电视大学分校 石家庄050016石家庄衡水053000

【摘要】 本文讨论了7辐射源激发 X 射线荧光法用于测定金属镀层镀布量的三种方法。给出了各自的计算方法和实验结果。并同其他实验手段做了比对。认为这是非破坏性测定镀布量小于几 mg/cm~2 的镀层的最准确方法。方法简单易行,主要靠物理计算。实验中只用两片纯金属片作比较即可。

【Abstract】 Three methods of determining metal plating mass thickness by X ray fluorescence method using gamma radiation source have been discussed in this paper,their calculation method and experiment results have been given.Authors contrast them with other determination means,and think that X ray fluorescence method is most accurate method of determining metal plating mass thickness less than several mg/cm~2 non-destructive- ly.X ray fluorescence methods are simple,easy and mainly depend on physical calculation.Only two small pieces of pure metal plate are used to compare in the experiment.

【关键词】 镀层镀布量X 射线荧光
【Key words】 Metal playingMass thicknessX ray fluorescence
  • 【文献出处】 核电子学与探测技术 ,Nuclear Electronics & Detection Technology , 编辑部邮箱 ,1995年05期
  • 【分类号】TL81
  • 【下载频次】34
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