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金属镀层镀布量的X射线荧光测定
Determination of Metal Plating Mass Thickness by X Ray Fluorescence Method
【摘要】 本文讨论了7辐射源激发 X 射线荧光法用于测定金属镀层镀布量的三种方法。给出了各自的计算方法和实验结果。并同其他实验手段做了比对。认为这是非破坏性测定镀布量小于几 mg/cm~2 的镀层的最准确方法。方法简单易行,主要靠物理计算。实验中只用两片纯金属片作比较即可。
【Abstract】 Three methods of determining metal plating mass thickness by X ray fluorescence method using gamma radiation source have been discussed in this paper,their calculation method and experiment results have been given.Authors contrast them with other determination means,and think that X ray fluorescence method is most accurate method of determining metal plating mass thickness less than several mg/cm~2 non-destructive- ly.X ray fluorescence methods are simple,easy and mainly depend on physical calculation.Only two small pieces of pure metal plate are used to compare in the experiment.
- 【文献出处】 核电子学与探测技术 ,Nuclear Electronics & Detection Technology , 编辑部邮箱 ,1995年05期
- 【分类号】TL81
- 【下载频次】34