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大面积超导膜均匀性测量装置

AN APPARATUS FOR DETECTING THE HONOGENEITY OF LARGE AREA HIGH-Tc SUPERCONDUCTING FILMS

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【作者】 马立平李宏成王瑞兰李林

【Author】 L.P.Ma;H.C.Li;R.L.Wang;L.Li(National Laoratory for Superconductivity,Institute of Physics,Chinese Academy of Sciences,Beijing 100080)

【机构】 中国科学院物理研究所

【摘要】 本文报道由感应法测量大面积高温超导膜均匀性的装置.其特点是探头可以在液氮温区进行两维移动,从而对大面积膜的不同区域进行测量以达到均匀性测量的目的.测量包括超导转变温度Tc及临界面电流密度Kc的测量.可测样品的最大尺寸是50×50mm2.从对该装置进行测试的实验表明;该装置可提供被测样品温度的均匀性优于0.02K/cm,在面电流密度Kc的测量中,系统引起的相对误差小于5%.

【Abstract】 AbstractAn apparatus with inductive method has been established to detect the homogeneity of large area high-Tc superconducting films.it’s probe can be moved in two dimentions at liquid nitrogen temperature in order to test the different regions of the films.The tests include the measurement of the superconducting transition temperature Tc,and that of the critical sheet current density Kc.The maximum sample size that can be measured is 50×50mm2.It was proved from the tests of the measurements that the apparatus can provide,films being detected with temperature homogeneity better than 0.02K/cm,and causes a relative error less than 5% in the measurements of Kc.

  • 【文献出处】 低温物理学报 ,CHINESE JOURNAL OF LOW TEMPERATURE PHYSICS , 编辑部邮箱 ,1995年05期
  • 【分类号】O511
  • 【下载频次】32
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