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聚焦离子束(FIB)刻蚀在光电子器件方面的应用
THE APPLICATION OF FOCUSED ION BEAM ETCHING TO OPTOELECTRONIC DEVICES
【摘要】 聚焦离子束无掩模微细加工技术逐渐引起人们的兴趣,它包括聚焦离子束无掩模刻蚀、注入、往积、光刻等。聚焦离子束刻蚀能在半导体激光器材料上加工得到具有光学精度的表面。首先论述聚焦离子束刻蚀的特点,然后概括说明目前它在光电子器件方面的若干应用。
【Abstract】 There has been an increasing interest in focused ion beam maskless microfabrication technology It includes focused ion beam maskless etching, implantation deposition lithography etc Focused,lithography, ect Focused ion bearm teching is capable of forming optical quality surfaces in semiconductor laser materials This paper describes the characteristics of focused ion beam the and reviews some of the recoent application of focused ion beam etching to optoelectronic devices.
【关键词】 聚焦离子束;
无掩模刻蚀;
光电子器件;
【Key words】 Focused ion beam (FIB); Maskless etching; Optoelectronic device;
【Key words】 Focused ion beam (FIB); Maskless etching; Optoelectronic device;
- 【文献出处】 真空科学与技术 , 编辑部邮箱 ,1994年04期
- 【分类号】TN305
- 【被引频次】7
- 【下载频次】437